Laser Beam Analysis

Catalog

Details on all of our laser measurement instruments.

Catalog

A laser beam profiler will increase your chance of success anytime you wish to design or apply a laser or when you find your laser system is no longer meeting specifications. You would …

Technical Article

Three Tips to Protect Your BeamSquared Device

Here are three tipps how to ensure precise measurement with your Ophir BeamSquared system over years.

Technical Article

Rayleigh Scatter, and Adhering to ISO 11146

This document is intended to show how the process of obtaining data and providing measurements using Ophir-Spiricon’s Rayleigh-scatter beam profiling technology, BeamWatch®, aligns …

Technical Article

Overcoming the Challenges of Measuring High Power NIR Lasers

High power laser application has significantly increased in recent years due to new production techniques that enable cheaper manufacturing and operating costs. Applications of high-power …

Technical Article

Quality Assurance in Additive Manufacturing

Whether in research or in production, the laser parameters must be checked regularly. For this purpose, Fraunhofer IAPT generally turns to the Ophir BeamWatch AM, which measures the …

Technical Article

SLM Troubleshooting Made Easy with BeamWatch® AM

When we developed BeamWatch AM, we not only drew diagrams and thought about great features, we also talked to experienced manufacturers of selective laser melting (SLM) machines about …

Technical Article

What to Expect in a Laser Profiling Demonstration

You may be wondering what to expect when you ask us for a laser beam profiling demo. Here's how it works.

Technical Article

Sensor Fusion Enables Comprehensive Analysis of Laser Processing in Additive Manufacturing

Successful outcomes require the power density distribution of the laser beam, as it is delivered to the work, to be symmetrical, uniform, and stable.

Technical Article

Reducing Production Waste with Laser Profiling

A laser profiling system can be of great benefit in helping to characterize and identify which variables affect product quality and waste minimization.

Technical Note

Total Optical Path Length with Beam Splitters on 4.5 mm Recessed CCD Cameras

Often we get requests for the Total Optical Path Length when beam splitters are used on our line of 4.5 mm recessed CCD cameras.

Technical Note

“What’s This” function in BeamGage 6.8

Problem: The “What’s This” feature only opens to the first page of the manual in Adobe Ready XI. Solution: Open your Adobe Reader XI

Technical Note

Using the built in photodiode trigger on the SP620U and SP503U cameras

With the introduction of BeamGage the capability of using the built in photodiode trigger in the SP camera series is now available.

Technical Article

University Research Team Faces Challenges of Measuring Multiple Lasers

The scientific community is often faced with the requirement of testing, validating, or merely qualifying several laser sources planned for a particular project.

Technical Article

Reimaging UV Laser Beam Profiling

Ophir Photonics offers a number of solutions for profiling UV laser beams. Spot sizes from 0.15 mm to over 25 mm can be safely profiled without the risk of camera sensor damage or …

Technical Article

Overcoming Barriers to Industrial Laser Performance Measurement

During the development of these laser systems and installation in the applications in which they will be put into service, performance measurements of the components and the system …

Technical Article

Technology’s Role in the Evolution from Laser Technician to Laser Technology Specialist

The skills required to understand, troubleshoot, and correct problems with lasers, and the systems they are a part of, are in high demand. It's all part of an evolution whereby yesterday's …

Technical Article

Scanning Slit vs Camera-Based Beam Analyzers

In part 1, we discussed camera technologies that are available for covering various wavelengths. There are similar options for scanning slit profilers.

Technical Note

Outputting Data from Photon Instruments

We are frequently asked how one can output data from the NanoScan to other programs for additional analysis or publication. Depending nature of the desired end results there can be …

Technical Note

Selecting the Correct Lens for M² Measurements with NanoModeScan

With the broad range of wavelengths that can be measured with this instrument, the first consideration is the material and anti-reflective coating of the lens. There are a number of …

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